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Advanced Packaging| 54042 Records Searched | 44 Matches |
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|  | Ultra-Thin 3-D ACA Flip-Chip-in-Flex Technology Tuesday, August 24, 2010 | J. Haberland, M. Becker, D. Lütke-Notarp, Ch. Kallmayer, R. Aschenbrenner, H. Reichl Die thickness of common, high-volume chip stacks range from 50 to 100 um while thinning industry aims for ultra-thin chips of 10 um thickness, or less. For the first time, the required interconnect length between vertically arranged adjacent chip layers has reached dimensions that can be reasonably realized by anisotropic conductive adhesives layers (ACA).
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|  | SMT Magazine Earns Positive Reviews, Mostly Monday, August 23, 2010 | SMT Magazine The reviews are in--and we're not talking about the latest summer blockbuster. Just one month after acquiring SMT Magazine, I-Connect007 published its first issue of the magazine. The feedback from loyal SMT readers has been overwhelmingly positive. SMT Magazine is just one example of what we have planned for the future.
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 |  | Emerging Market Opportunities Fuel Interest in SEMICON Taiwan Monday, August 02, 2010 | SEMI Driven by strong IC market expansion and growth in emerging markets, SEMICON Taiwan 2010 returns to the Taipei World Trade Center September 8-10, 2010 with eight technology theme pavilions focusing on LEDs, MEMS, 3-D ICs and Advanced Packaging/Testing, Green Management, Compound Semiconductors, CMP, AOI and the Secondary Market for capital equipment.
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 |  | Small Wires Make Big Connections for Microelectronics Monday, July 19, 2010 | University of Illinois University of Illinois engineers have developed a novel direct-writing method for manufacturing metal interconnects that could shrink integrated circuits and expand microelectronics.
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|  | Applied Intros Latest TSV Production Innovation Monday, July 12, 2010 | BUSINESS WIRE With the Applied Producer Avila system, Applied Materials becomes the first equipment supplier to offer comprehensive TSV solutions for speeding the development and time to market of 3D-ICs.
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|  | Alchimer Secures Equity Investment from Panasonic Corporation Monday, July 12, 2010 | Alchimer Alchimer S.A., a provider of nanometric deposition technology for through-silicon vias (TSV), semiconductor interconnects, and other electronic applications, announced today that Panasonic Corporation has become an equity investor in the company.
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 |  | Report: Wafer Scale Packaging to Cut Costs Wednesday, June 23, 2010 | OfficialWire Advanced Electronic Packaging industry has grown to a position where its technology has outpaced the semiconductor technology, the parent industry it addresses.
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 |  | AquiVia Fill Sets New Standards for Metallization Process Tuesday, June 22, 2010 | Business Wire Alchimer S.A. today announced a ground-breaking advance for filling narrow, high-aspect-ratio TSVs while significantly reducing the need for chemical components in the metallization process.
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|  | Ultra-Thin 3-D ACA Flip-Chip-in-Flex Technology Tuesday, August 24, 2010 | J. Haberland, M. Becker, D. Lütke-Notarp, Ch. Kallmayer, R. Aschenbrenner, H. Reichl Die thickness of common, high-volume chip stacks range from 50 to 100 um while thinning industry aims for ultra-thin chips of 10 um thickness, or less. For the first time, the required interconnect length between vertically arranged adjacent chip layers has reached dimensions that can be reasonably realized by anisotropic conductive adhesives layers (ACA).
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|  | Metallization for Semi-Additive Processing, Part II: Processing of Next-Generation Build-Up Dielectric Materials Tuesday, July 13, 2010 | Hiroyuki Nishiwaki, Katsuhiro Yoshida and Shenghua Li, Rohm and Haas Electronic Materials KK, a Dow Group Company, The Dow Chemical Company Demands for higher performance, multifunctionality and size reduction require package substrates to offer improved high-speed signal transmission, higher wiring density and high system reliability. An SAP is widely used with build-up dielectric materials to form the circuit features. Features of such metallization processes are detailed here.
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|  | Metallization for Semi-Additive Processing of Build-Up Dielectric Materials, Part I: Process Development Overview Tuesday, June 08, 2010 | Hiroyuki Nishiwaki, Katsuhiro Yoshida and Shenghua Li, Rohm and Haas Electronic Materials KK, a Dow Group Company, The Dow Chemical Company Current demands require semiconductor package substrates to provide improved high-speed signal transmission capability, higher interconnect wiring density and high system reliability. An SAP is widely used with build-up dielectric materials to form the circuit features. This article describes the features of metallization processes for such applications.
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 |  | Real Time with...IPC Produces Over 100 Videos Wednesday, April 14, 2010 | Real Time With...IPC APEX Expo 2010 I-Connect007's team of editors, guest editors, videographers and video editors worked throughout the show to capture the keynotes, the industry's top technologists and business leaders, bringing our readers and viewers the world's most comprehensive event coverage and content.
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|  | Metallization for Semi-Additive Processing, Part II: Processing of Next-Generation Build-Up Dielectric Materials Tuesday, July 13, 2010 | Hiroyuki Nishiwaki, Katsuhiro Yoshida and Shenghua Li, Rohm and Haas Electronic Materials KK, a Dow Group Company, The Dow Chemical Company Demands for higher performance, multifunctionality and size reduction require package substrates to offer improved high-speed signal transmission, higher wiring density and high system reliability. An SAP is widely used with build-up dielectric materials to form the circuit features. Features of such metallization processes are detailed here.
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|  | Metallization for Semi-Additive Processing of Build-Up Dielectric Materials, Part I: Process Development Overview Tuesday, June 08, 2010 | Hiroyuki Nishiwaki, Katsuhiro Yoshida and Shenghua Li, Rohm and Haas Electronic Materials KK, a Dow Group Company, The Dow Chemical Company Current demands require semiconductor package substrates to provide improved high-speed signal transmission capability, higher interconnect wiring density and high system reliability. An SAP is widely used with build-up dielectric materials to form the circuit features. This article describes the features of metallization processes for such applications.
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|  | Metallization for Semi-Additive Processing, Part II: Processing of Next-Generation Build-Up Dielectric Materials Tuesday, July 13, 2010 | Hiroyuki Nishiwaki, Katsuhiro Yoshida and Shenghua Li, Rohm and Haas Electronic Materials KK, a Dow Group Company, The Dow Chemical Company Demands for higher performance, multifunctionality and size reduction require package substrates to offer improved high-speed signal transmission, higher wiring density and high system reliability. An SAP is widely used with build-up dielectric materials to form the circuit features. Features of such metallization processes are detailed here.
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|  | Metallization for Semi-Additive Processing of Build-Up Dielectric Materials, Part I: Process Development Overview Tuesday, June 08, 2010 | Hiroyuki Nishiwaki, Katsuhiro Yoshida and Shenghua Li, Rohm and Haas Electronic Materials KK, a Dow Group Company, The Dow Chemical Company Current demands require semiconductor package substrates to provide improved high-speed signal transmission capability, higher interconnect wiring density and high system reliability. An SAP is widely used with build-up dielectric materials to form the circuit features. This article describes the features of metallization processes for such applications.
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