What do you want to search for?
Refine your search:
Choose a Topic:
When Published:

Type:




Where in the World?

Advanced Packaging

54042 Records Searched44 Matches
NEWS    September 2, 2010
PAGE 1 of 5.     NEXT 10 RESULTS
 
Ultra-Thin 3-D ACA Flip-Chip-in-Flex Technology
Tuesday, August 24, 2010 | J. Haberland, M. Becker, D. Lütke-Notarp, Ch. Kallmayer, R. Aschenbrenner, H. Reichl    
Die thickness of common, high-volume chip stacks range from 50 to 100 um while thinning industry aims for ultra-thin chips of 10 um thickness, or less. For the first time, the required interconnect length between vertically arranged adjacent chip layers has reached dimensions that can be reasonably realized by anisotropic conductive adhesives layers (ACA).
SMT Magazine Earns Positive Reviews, Mostly
Monday, August 23, 2010 | SMT Magazine    
The reviews are in--and we're not talking about the latest summer blockbuster. Just one month after acquiring SMT Magazine, I-Connect007 published its first issue of the magazine. The feedback from loyal SMT readers has been overwhelmingly positive. SMT Magazine is just one example of what we have planned for the future.
Trial Kit Enables 50-micron High-density Thick-film Circuits
Tuesday, August 10, 2010 | DKN Research    
DKN Research is now offering a Fine Silver Conductor Trial Kit capable of producing fine lines down to 50 microns to companies interested in producing high density thick film circuits.
Emerging Market Opportunities Fuel Interest in SEMICON Taiwan
Monday, August 02, 2010 | SEMI    
Driven by strong IC market expansion and growth in emerging markets, SEMICON Taiwan 2010 returns to the Taipei World Trade Center September 8-10, 2010 with eight technology theme pavilions focusing on LEDs, MEMS, 3-D ICs and Advanced Packaging/Testing, Green Management, Compound Semiconductors, CMP, AOI and the Secondary Market for capital equipment.
Small Wires Make Big Connections for Microelectronics
Monday, July 19, 2010 | University of Illinois    
University of Illinois engineers have developed a novel direct-writing method for manufacturing metal interconnects that could shrink integrated circuits and expand microelectronics.
EV Group Develops Bonding System for HB LEDs Manufacturing
Monday, July 12, 2010 | PRNewswire    
EV Group has launched the EVG560HBL wafer bonder -- the industry's first fully automated wafer bonding system for high-brightness light emitting diode (HB-LED) manufacturing.
Applied Intros Latest TSV Production Innovation
Monday, July 12, 2010 | BUSINESS WIRE    
With the Applied Producer Avila system, Applied Materials becomes the first equipment supplier to offer comprehensive TSV solutions for speeding the development and time to market of 3D-ICs.
Alchimer Secures Equity Investment from Panasonic Corporation
Monday, July 12, 2010 | Alchimer    
Alchimer S.A., a provider of nanometric deposition technology for through-silicon vias (TSV), semiconductor interconnects, and other electronic applications, announced today that Panasonic Corporation has become an equity investor in the company.
Report: Wafer Scale Packaging to Cut Costs
Wednesday, June 23, 2010 | OfficialWire    
Advanced Electronic Packaging industry has grown to a position where its technology has outpaced the semiconductor technology, the parent industry it addresses.
AquiVia Fill Sets New Standards for Metallization Process
Tuesday, June 22, 2010 | Business Wire    
Alchimer S.A. today announced a ground-breaking advance for filling narrow, high-aspect-ratio TSVs while significantly reducing the need for chemical components in the metallization process.
FEATURES    September 2, 2010
Ultra-Thin 3-D ACA Flip-Chip-in-Flex Technology
Tuesday, August 24, 2010 | J. Haberland, M. Becker, D. Lütke-Notarp, Ch. Kallmayer, R. Aschenbrenner, H. Reichl    
Die thickness of common, high-volume chip stacks range from 50 to 100 um while thinning industry aims for ultra-thin chips of 10 um thickness, or less. For the first time, the required interconnect length between vertically arranged adjacent chip layers has reached dimensions that can be reasonably realized by anisotropic conductive adhesives layers (ACA).
Metallization for Semi-Additive Processing, Part II: Processing of Next-Generation Build-Up Dielectric Materials
Tuesday, July 13, 2010 | Hiroyuki Nishiwaki, Katsuhiro Yoshida and Shenghua Li, Rohm and Haas Electronic Materials KK, a Dow Group Company, The Dow Chemical Company    
Demands for higher performance, multifunctionality and size reduction require package substrates to offer improved high-speed signal transmission, higher wiring density and high system reliability. An SAP is widely used with build-up dielectric materials to form the circuit features. Features of such metallization processes are detailed here.
Metallization for Semi-Additive Processing of Build-Up Dielectric Materials, Part I: Process Development Overview
Tuesday, June 08, 2010 | Hiroyuki Nishiwaki, Katsuhiro Yoshida and Shenghua Li, Rohm and Haas Electronic Materials KK, a Dow Group Company, The Dow Chemical Company    
Current demands require semiconductor package substrates to provide improved high-speed signal transmission capability, higher interconnect wiring density and high system reliability. An SAP is widely used with build-up dielectric materials to form the circuit features. This article describes the features of metallization processes for such applications.
The Future of Halogen-Free Materials
Friday, May 14, 2010 | Real Time With...IPC APEX Expo 2010    
Minsu (Tim) Lee Ph.D., Senior Researcher at Doosan Electro-Materials, discusses his company's long history with halogen-free materials. Doosan provides highly-reliable and environmentally-friendly substrate material for IC packages.
Real Time with...IPC Produces Over 100 Videos
Wednesday, April 14, 2010 | Real Time With...IPC APEX Expo 2010    
I-Connect007's team of editors, guest editors, videographers and video editors worked throughout the show to capture the keynotes, the industry's top technologists and business leaders, bringing our readers and viewers the world's most comprehensive event coverage and content.
ARTICLES    September 2, 2010
Metallization for Semi-Additive Processing, Part II: Processing of Next-Generation Build-Up Dielectric Materials
Tuesday, July 13, 2010 | Hiroyuki Nishiwaki, Katsuhiro Yoshida and Shenghua Li, Rohm and Haas Electronic Materials KK, a Dow Group Company, The Dow Chemical Company    
Demands for higher performance, multifunctionality and size reduction require package substrates to offer improved high-speed signal transmission, higher wiring density and high system reliability. An SAP is widely used with build-up dielectric materials to form the circuit features. Features of such metallization processes are detailed here.
Metallization for Semi-Additive Processing of Build-Up Dielectric Materials, Part I: Process Development Overview
Tuesday, June 08, 2010 | Hiroyuki Nishiwaki, Katsuhiro Yoshida and Shenghua Li, Rohm and Haas Electronic Materials KK, a Dow Group Company, The Dow Chemical Company    
Current demands require semiconductor package substrates to provide improved high-speed signal transmission capability, higher interconnect wiring density and high system reliability. An SAP is widely used with build-up dielectric materials to form the circuit features. This article describes the features of metallization processes for such applications.
The Future of Halogen-Free Materials
Friday, May 14, 2010 | Real Time With...IPC APEX Expo 2010    
Minsu (Tim) Lee Ph.D., Senior Researcher at Doosan Electro-Materials, discusses his company's long history with halogen-free materials. Doosan provides highly-reliable and environmentally-friendly substrate material for IC packages.
COLUMNS    September 2, 2010
Metallization for Semi-Additive Processing, Part II: Processing of Next-Generation Build-Up Dielectric Materials
Tuesday, July 13, 2010 | Hiroyuki Nishiwaki, Katsuhiro Yoshida and Shenghua Li, Rohm and Haas Electronic Materials KK, a Dow Group Company, The Dow Chemical Company    
Demands for higher performance, multifunctionality and size reduction require package substrates to offer improved high-speed signal transmission, higher wiring density and high system reliability. An SAP is widely used with build-up dielectric materials to form the circuit features. Features of such metallization processes are detailed here.
Metallization for Semi-Additive Processing of Build-Up Dielectric Materials, Part I: Process Development Overview
Tuesday, June 08, 2010 | Hiroyuki Nishiwaki, Katsuhiro Yoshida and Shenghua Li, Rohm and Haas Electronic Materials KK, a Dow Group Company, The Dow Chemical Company    
Current demands require semiconductor package substrates to provide improved high-speed signal transmission capability, higher interconnect wiring density and high system reliability. An SAP is widely used with build-up dielectric materials to form the circuit features. This article describes the features of metallization processes for such applications.
MOST READ
MOST EMAILED