EMAIL   PRINT
Zero Defects Int'l Test & Inspection Conference a Success
Wednesday, August 26, 2009 | Zero Defects International

The initial Zero Defects International PCBA Test and Assembly conference and open house proved to be successful beyond expectations. Held at the Viscom, Inc. Silicon Valley Technical Center, and hosted by an international group of equipment and software vendors, the products included every technology needed to inspect and test printed circuit assemblies in production levels, as well as prototype manufacturing.

Sponsors included Viscom (X-Ray and AOI), Seica, Inc. (ICT testers and flying-probes), ReMaTek, Inc. (ICT and functional test fixtures) and Temento (boundary scan solutions). Countries of origin for all products shown and demonstrated included Germany, Italy, Canada, France, the United States and China.

Zero Defects has made available CDs containing all papers presented and all product information provided during the open house and conference. Requests for CDs should be made via e-mail at conference@zdefects.com.

For further Information, visit http://www.zdefects.com/.


EMAIL   PRINT


Related Articles:
  • Zero Defects, Viscom to Host Solar Test Open House
  • Reinvention: A Smart Strategic Shift
  • Zero Defects Holds Test and Inspection Conf. August 13, 2009
  • Zero Defects Announces Test 7 Inspection Seminar
  • Rematek, Landrex and Zero Defects Announce Alliance

  • MOST READ
    MOST EMAILED