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	<title>Reid on Reliability: Interconnect Separation Anxiety</title>
	<description>Interconnect separation is usually expressed as a crack that propagates at the internal interconnection. This failure mode produces a crack that is wedge-shaped, with the large end on the side of the foil closest to the middle of the PWB. An interconnect failure frequently develops slowly over time, accumulating damage at a constant rate after onset.</description>
	<link>http://www.pcb007.com/pages/zone.cgi?a=70391</link>
	<pubDate>Wed, 18 Aug 2010 21:42:00 GMT</pubDate>
</item>
<item>
	<title>PWB Barrel Cracks: Wear-Out Failures</title>
	<description>Developers of mil/aero and other high-rel applications depend on solid failure analysis. Paul Reid discusses how thermal cycling will cause a robust plated through-hole to crack slowly over time. Plotting a resistance graph of damage accumulation allows technologists to determine onset, rate of accumulation and whether the damage is accelerating linearly or exponentially. </description>
	<link>http://www.pcb007.com/pages/zone.cgi?a=58530</link>
	<pubDate>Wed, 18 Aug 2010 12:39:00 GMT</pubDate>
</item>
<item>
	<title>Reid on Reliability: The Corner Crack</title>
	<description>Corner cracks are observed less often than barrel cracks, but with high-rel boards, we can't be too careful. Unlike barrel cracks, which can fail catastrophically, knee cracks tend to propagate over time. The damaged pad actually resembles a funnel and the warp and weft of the glass give the funnel an uneven, puckered shape. </description>
	<link>http://www.pcb007.com/pages/zone.cgi?a=69569</link>
	<pubDate>Sat, 10 Jul 2010 12:07:00 GMT</pubDate>
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